Optical differentiator based on a trilayer metal-dielectric structure

Optical properties of a resonant trilayer metal-dielectric-metal (MDM) structure that consists an upper metal layer, dielectric and substrate are investigated. Using multiple wave interference model, we prove the reflection coefficient MDM may strictly vanish. The existence reflectance zero makes it possible to use as optical differentiator. numerical simulation results presented demonstrate possibility computation first derivative with respect either time or spatial variable. obtained find application in novel analog computing information processing systems.